Values First Consulting Sdn. Bhd. is an established engineering firm specializing in Computer Integrated Manufacturing (CIM) products and services for the semiconductor and electronics manufacturing industry world-wide.
X-Platform enables the user to extend or override existing business rules for different GEM scenarios as part of the SECS communication exchange with machines. This opens the way for the user to adapt the X-Platform easily for various I4.0 requirements as and when they are required over time.
X-Platform comes with ready-to-use modules including Recipe Management, Unit-Level-Tracebility (wafermapping+strip-mapping), Engineering Data Collection, Equipment Performance Tracking. Web Services are provided for each functional module to be interfaced to an external host such as MES.
The use of mobile devices coupled with cloud services enable powerful inspection and image processing solutions to be delivered at a fraction of the cost of a typical piece of equipment (e.g. inspection machine) that is usually required for such applications.
Vision, Modeling, Prediction, Optimization – algorithms that power our X-Platform and Mobile Apps from the Cloud to meet your most demanding I4.0 needs.
Key Benefits of X-Platform:
Flexibility in customization
Improved Performance for Large Installations
Web Services/APIs for
Equipment Performance Tracking
Plug-in Framework for User Defined Business Rules for e.g.
Engineering Data Collection
Substrate Map Station Controller (SMSC)
Full range of station controller products for wafer-mapping, strip-mapping, panel mapping and unit-level traceability for all process steps. Plug-in business rules for recipe management, lot management, equipment performance tracking and engineering data collection for Industry 4.0. Full compliance with SEMI standards including E142, G85, etc.
Substrate Map Editor (SME)
Unit and Substrate map traceability, viewing and editing tool including map history, die stacking and multi-chip traceability with API for MES integration. This enables complete tracebility of each finished unit to specific product, device, substrate, machine and process recipe and consumable ID’s.
A versatile inspection tool for processed and semi-processed wafers and substrates, using an iPad...
An in-situ OCR reading of wafer ID's using an iPhone...
E142 Mobile App
IOS mobile app for display of multi-layer SEMI E142 substrate map, accurate down to the dimensions and placement locations of devices stipulated in the E142 xml file. Allows for editing of bin codes for each layer and secure saving of edited substrate map in E142 format via wireless update to storage cloud.
Recipe Management System
Complete, flexible integration solution combining myriad equipment model interfacing, automatic recipe selection in production, "live" monitoring of recipe changes on equipment, parameter range checking, email/sms alert, centralized recipe storage with version control, MES interfacing and engineering tools for recipe management. High performance software running in cluster mode enable large quantities of equipment to be hooked up with smaller PC footprint and with high availability.
Equipment Performance Tracking
SEMI Standards-based EPT & OEE reporting using "live" data captured from production equipment. Powerful web-based graphical display of indicators such as MTBA, MTBF, MTTR, uptime/downtime, equipment states, alarms pareto, OEE, etc., sliced according to combinations of attributes such as product, production line/module no., equipment model, time period, etc. Comes with options for SECS/GEM as well as non-SECS/GEM equipment interface, plus wireless terminal data capture.
+60 4 643 2300
46-1 & 46-2 Persiaran Bayan Indah (Bayan Bay),
Sungai Nibong, Bayan Lepas 11900,